Impact of Carbon and Platinum Protective Layers on EDS Accuracy in FIB Cross-Sectional Analysis of W/Hf/W thin-film multilayers

XE-PLASMA FOCUSED ION BEAM PROCESSING WITH GAAS-BASED QD

Maciej Jaworski, Aleksandra Chudzyńska, Paweł Mrowiński, Joanna Prażmowska-Czajka, Wojciech Kijaszek, Jan Große, Sven Rodt, Stephan Reitzenstein, and Grzegorz Sęk We’re thrilled to announce the recent scientific publication by our colleague, Maciej Jaworski. His...
EDS Elemental analysis

EDS Elemental analysis

Color photos rarely appear on our website. After all, the electron microscope differs from the light microscope. This time, however, we will probably surprise you with the number of colors. One of our apprentices wanted to check the quality of the copper layer that...
EDS Elemental analysis

FEBID/FIBID artistic structure

At Nanores, we use FEBID/FIBID (Focus Electron or Ion Beam Induced Deposition) every day to protect the top layers of samples. This process is sometimes used by us to create structures serving as physical or electrical connections in some of our other designs. This...