XE-PLASMA FOCUSED ION BEAM PROCESSING WITH GAAS-BASED QD

XE-PLASMA FOCUSED ION BEAM PROCESSING WITH GAAS-BASED QD

Maciej Jaworski, Aleksandra Chudzyńska, Paweł Mrowiński, Joanna Prażmowska-Czajka, Wojciech Kijaszek, Jan Große, Sven Rodt, Stephan Reitzenstein, and Grzegorz Sęk We’re thrilled to announce the recent scientific publication by our colleague, Maciej Jaworski. His...
EDS Elemental analysis

EDS Elemental analysis

Color photos rarely appear on our website. After all, the electron microscope differs from the light microscope. This time, however, we will probably surprise you with the number of colors. One of our apprentices wanted to check the quality of the copper layer that...
EDS Elemental analysis

New publication in Acta Physica Polonica A

Modrzynski Pawel, Olejniczak Adam, Zieba Aneta, Kunicki Piotr, Tomanik Magdalena, Wielebski Marcin, et al. “The Influence of Sub-Wavelength Effective Refractive Index Layer on the Transmittance of LYSO Scintillator.” Acta Physica Polonica A. doi:...